User2User Design-for-Test Forum 2026

About User2User Design-for-Test Forum 2026 India

Driving Innovations in Test from Design to Device

As semiconductor designs evolve in complexity, integrating greater functionalities and advanced compute capabilities, the necessity for rigorous testing becomes increasingly paramount. In this dynamic landscape, ensuring device reliability and performance throughout its lifecycle is essential. Design for Test (DFT) is pivotal in this process, empowering engineers to embed effective testability features within their designs. Strategies such as shift-left approaches, advanced Automatic Test Pattern Generation (ATPG) techniques, and efficient test data delivery during manufacturing and in-system testing are crucial. This event invites you to explore these technologies and more.

We will examine the transformative power of in-system testing in responding to the industry's heightened demands, driven by escalating design complexity and exponential growth. In this era of intricate semiconductor devices, the need for efficient and effective testing solutions is more critical than ever. Tessent's in-system test technology facilitates infield testing, ensuring reliability and performance across the product lifecycle. The event offers a valuable platform for attendees to discover ways in-system testing addresses contemporary challenges, maintaining high-quality standards while optimizing testing strategies in an ever-evolving semiconductor design landscape. Join us to witness how Tessent is establishing new standards in test efficiency and adaptability.

Join us for the Siemens User2User Design-for-Test (DFT) Forum, being held in Hotel Radisson Blu, Marathalli ORR, Bengaluru, India, on 10th March, 2026 learn from Industry leaders, fellow designers and experts from Siemens about how to leverage the Tessent Platform to address your Design-for-Test challenges while solving more complex challenges. This full day forum will focus on key test challenges IC designers, hardware and validation engineers face as they enter the everchanging world of AI, ML, in-system and autonomous era

Slots are limited to maximize your learning experience, submit your registration immediately to request your spot today.

Share your innovation. Submit a paper to speak at India’s leading DFT event. Bring your expertise in chip test, AI/ML, ATPG and test methodologies to move the industry forward.

CALL FOR PAPERS IS NOW OPEN

Seize the opportunity to share your expertise! Submit an abstract by January 20, 2026.

Deadline: January 20, 2026

Include the following information while submitting the abstract:

Personal Details: First name, Last name, Job title, Company name, Email address, Work phone number.

Presentation Details: Title (up to 10 words), Abstract (up to 300 words).

Why attend User2User Design-for-Test Forum 2026 India?

A place to connect

Exclusive event for our executive and global community to share strategies on how they are transforming their organization's business process, products, and industry through digitalization.​ 

What will you learn

-  Discover how i-Discover the latest features in Streaming Scan technology which are powering newer & rapid advancements in test.

-  Understand the implementation and benefits recent technologies in MemoryBIST and repair solutions improving quality & verification process.

-  Insights into real-world applications where Tessent products have been leveraged uniquely by customers, highlighting customer success stories and innovative usage scenarios.

-  Explore the future trends in semiconductor testing and monitoring where Tessent's cutting-edge solutions are leading the way in innovation and technology advancement.

Access to a wealth of content on DFT

The opportunity to meet peers and Design for Test(DFT) experts to address and resolve strategic opportunities and tactical barriers.​ 

Design Engineers and Experts from around the Globe come together to learn how to improve the DFT experiences and capabilities.​ 

What to expect? 

An exclusive, unique experience to understand about the latest Design for Test techniques besides listening to leading experts who are leading the change in the Industry. 

• Executive-level concentrated agenda on the digital future 

• Industry leaders presenting Design for Test use cases 

• Innovation leaders sharing business challenges and roadblocks 

• Content demonstrating business results 

• Proven strategies for successful business transformation 

… and more than 6 hours of networking with like-minded peers! 

 

Key Speakers